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当谈论球差校正透射电镜时,我们在谈论什么?

What are we talking about when we talk about aberration-corrected transmission electron microscopy?

  • 摘要: 透射电子显微镜(简称透射电镜)是能够直观分析材料微结构的最重要工具之一。在透射电镜近百年的发展历史中,近些年来球差校正透射电镜的研发与应用乃是最具革命性的发展,不但进一步延伸了通向微观世界之路,更为材料科学的快速发展提供了关键的工具与研究方法。文章通过介绍球差校正透射电镜的原理、优势、应用及发展,来回答“什么是球差校正透射电镜”,“球差校正透射电镜有什么突出作用”,“球差校正透射电镜除了拍原子还能做什么”这三个问题。

     

    Abstract: Transmission electron microscopy (TEM) has been one of the most important analysis techniques to visualize the microstructure of materials in a direct way. In the course of almost a hundred years of progress, the birth of aberration-corrected TEM (AC-TEM) has been the most recent revolutionary development, and has been essential for the advancement of materials science in the past decades. In this article, we review the principle, advantages, applications and developments of AC-TEM through three questions:“What is AC-TEM?”,“How is AC-TEM advan‐tageous?”,“What else can AC-TEM do more than acquiring atomic-resolution images?”.

     

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