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Z衬度扫描透射电子显微术的前沿进展

Z-contrast scanning transmission electron microscopy in materials science

  • 摘要: 文章介绍了Z衬度扫描透射电子显微术 (Z-scanning transmission electron microscopy, Z-STEM, Z为原子序数)的最新进展: Z-STEM可以直接“观察”到晶体中原子的真实位置, Z衬度图像的分辨率在经过球差校正后可达0.6;在利用Z衬度成像技术对材料的阴极荧光(cathodoluminescence,CL)性质的研究中,首次观察到了“死层”(dead layer)的存在.然后,文章以半导体与结晶氧化物界面结构、Al72Ni20Co8十角形准晶结构以及SrTiO3晶界结构为例,具体介绍了Z衬度成像在测定物质结构与化学组成方面独特的优势.

     

    Abstract: Z-contrast scanning transmission electron microscopy (Z-STEM) can directly provide imaging at an atomic resolution. With the help of aberration correction, a resolution as high as 0.6 can be reached. In this article we will describe some typical applications of Z-contrast STEM imaging. From the cathodoluminescent properties of Eu doped Y2O3 thin films, we reveal the presence of the "dead layer". Then, with three examples, we present the unparalleled advantages of Z-contrast imaging in determining the structure, physical properties and chemical composition of crystals.

     

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